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Insertion Loss Data

Component:

Global Part Number:

Dielectric:

Capacitance:

Voltage:

Size:

Temperature Coefficient:

BB0502X7R123M16VP820

MBB0502X123MGP5N8-

X7R

12nF, 82pF

16VDC

0502

±15% (-55C, +125C)

Measured on fused silica (500MHz-40GHz)

Line Width 23 Mils

Gap Width 5 Mils

Figure 1 - 10mil Quartz Test fixture.
The capacitors were mounted to pad stacks on 10-mil fused silica. Series 2-port S-parameter measurements were made using a vector network analyzer that was calibrated to the outer edge of the pad stacks. Test fixture artifacts were removed from the initial S-parameter data by de-embedding the pad stack effects, and subsequently extracting stray capacitance to ground using a pi-network equivalent circuit. The presented data is thus nominally test-fixture independent. Presented below is the de-embedded and extracted data.

Figure 2 - Average magnitude extracted S11 (dB) of Capacitor: BB0502X7R123M16VP8205 Lot: 020911-70 measured on 10mil Quartz.
{Transmission line effects and capacitance to ground removed.}

Figure 3 - Average magnitude extracted S21 (dB) of Capacitor: BB0502X7R123M16VP8205 Lot: 020911-70 measured on 10mil Quartz.
{Transmission line effects and capacitance to ground removed.}

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